Toward Automated Chemical Analysis of Materials Using Secondary Electron Hyperspectral Imaging and Unsupervised Learning

Advancements in materials science have significantly transformed materials discovery and advanced manufacturing. This, along with the rapid development of sensing and instrumentation, results in a continuous increase in data volumes. To address the limitations of conventional manual analysis, this p...

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書誌詳細

出版年:	IEEE Access
主要な著者:	Jingqiong Zhang, Nicholas T. H. Farr, James Nohl, Yufeng Lai, Kerry J. Abrams, Kate Black, Jon Willmott, Cornelia Rodenburg, Lyudmila Mihaylova
フォーマット:	論文
言語:	英語
出版事項:	IEEE 2025-01-01
主題:	Advanced manufacturing artificial intelligence Gaussian mixture models material surface chemistry microscopy probabilistic clustering
オンライン･アクセス:	https://ieeexplore.ieee.org/document/11184813/