Reliability and Operation Cost of Underdamped Memories during Cyclic Erasures
Abstract The reliability of fast repeated erasures is studied experimentally and theoretically in a 1‐bit underdamped memory. The bit is encoded by the position of a micro‐mechanical oscillator whose motion is confined in a double well potential. To contain the energetic cost of fast erasures, a res...
| 出版年: | Advanced Physics Research |
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| 主要な著者: | , , |
| フォーマット: | 論文 |
| 言語: | 英語 |
| 出版事項: |
Wiley-VCH
2024-02-01
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| 主題: | |
| オンライン・アクセス: | https://doi.org/10.1002/apxr.202300074 |
