A multi-point calibration method for electron probe microanalysis (EPMA) of indium in sphalerite (ZnS)

Abstract This article presents a multi-point calibration approach for electron probe microanalysis (EPMA) for the trace element analysis of indium in sphalerite (ZnS). To define a multi-point calibration curve, indium and cadmium-doped ZnS crystals in a concentration range from 0 (blank) to ~ 1500 µ...

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Bibliographic Details
Published in:Scientific Reports
Main Authors: Thomas Schirmer, Thomas Ulrich
Format: Article
Language:English
Published: Nature Portfolio 2025-03-01
Subjects:
Multi-point calibration
EPMA
Indium
Sphalerite
ZnS
Online Access:https://doi.org/10.1038/s41598-025-91085-x

Internet

https://doi.org/10.1038/s41598-025-91085-x

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