Ferroelectric HfZrO<sub>x</sub> FETs on SOI Substrate With Reverse-DIBL (Drain-Induced Barrier Lowering) and NDR (Negative Differential Resistance)
Ferroelectric-Hf<sub>1-x</sub>Zr<sub>x</sub>O<sub>2</sub> FETs on silicon on insulator (SOI) are modeled and demonstrated with improvement on subthreshold swing (SS) and hysteresis (V<sub>T</sub>-shift), which is based on the capacitance matching conce...
| Published in: | IEEE Journal of the Electron Devices Society |
|---|---|
| Main Authors: | , , , , , , , , , , , , , , |
| Format: | Article |
| Language: | English |
| Published: |
IEEE
2018-01-01
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| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8425629/ |
