GIWAXS Characterization of Metal–Organic Framework Thin Films and Heterostructures: Quantifying Structure and Orientation

Abstract For optoelectronic applications of metal–organic framework (MOF) thin films, it is important to be able to fabricate films and heterostructures that are highly oriented relative to the substrate's surface normal. However, process optimization to achieve this is difficult without suffic...

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Bibliographic Details
Published in:Advanced Materials Interfaces
Main Authors: Jan C. Fischer, Chun Li, Sebastian Hamer, Lars Heinke, Rainer Herges, Bryce S. Richards, Ian A. Howard
Format: Article
Language:English
Published: Wiley-VCH 2023-04-01
Subjects:
crystallite orientation
depth‐profiling
GIWAXS
heterostructures
oriented metal–organic framework thin films
Online Access:https://doi.org/10.1002/admi.202202259

Internet

https://doi.org/10.1002/admi.202202259

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