New approach for FIB-preparation of atom probe specimens for aluminum alloys.
Site-specific atom probe tomography (APT) from aluminum alloys has been limited by sample preparation issues. Indeed, Ga, which is conventionally used in focused-ion beam (FIB) preparations, has a high affinity for Al grain boundaries and causes their embrittlement. This leads to high concentrations...
| Published in: | PLoS ONE |
|---|---|
| Main Authors: | , |
| Format: | Article |
| Language: | English |
| Published: |
Public Library of Science (PLoS)
2020-01-01
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| Online Access: | https://doi.org/10.1371/journal.pone.0231179 |