Fastest Thickness Measurements with a Terahertz Time-Domain System Based on Electronically Controlled Optical Sampling
We apply a fast terahertz time-domain spectroscopy (TDS) system based on electronically controlled optical sampling (ECOPS) to contact-free thickness gauging. Our setup achieves a measurement speed of 1600 terahertz pulse traces per second, which—to our knowledge—represents the f...
| 出版年: | Applied Sciences |
|---|---|
| 主要な著者: | , , , , , , , |
| フォーマット: | 論文 |
| 言語: | 英語 |
| 出版事項: |
MDPI AG
2019-03-01
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| 主題: | |
| オンライン・アクセス: | https://www.mdpi.com/2076-3417/9/7/1283 |
