Advances and challenges in dynamic photo-induced force microscopy

Abstract Photo-induced force microscopy (PiFM) represents a scanning probe technique renowned for its ability to provide high-resolution spectroscopic imaging at the nanoscale. It capitalizes on the amplification of tip motion by photo-induced forces, which are influenced by the response of the loca...

وصف كامل

التفاصيل البيبلوغرافية
الحاوية / القاعدة:Discover Nano
المؤلفون الرئيسيون: Hwi Je Woo, Mingu Kang, Yeonjeong Koo, Kyoung-Duck Park, Bongsu Kim, Eun Seong Lee, Junghoon Jahng
التنسيق: مقال
اللغة:الإنجليزية
منشور في: Springer 2024-11-01
الموضوعات:
Photo-induced force microscopy and spectroscopy
Amplitude modulation
Heterodyne
Homodyne
Photo-induced dipole force
Photo-induced thermal force
الوصول للمادة أونلاين:https://doi.org/10.1186/s11671-024-04150-1

الانترنت

https://doi.org/10.1186/s11671-024-04150-1

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