Reliability Analysis of Power IGBT Modules

Firstly, the module concept, packaging procedures, reliability and failure rules was presented. Then, the standard tests methodologies for investigating module reliability including endurance and environment tests were discussed. Lastly, the main failure mechanisms such as wire bonds failure, chip m...

詳細記述

書誌詳細
出版年:机车电传动
主要な著者: WANG Yan-gang, Jones Steve, LIU Guo-you
フォーマット: 論文
言語:中国語
出版事項: Editorial Department of Electric Drive for Locomotives 2013-01-01
主題:
オンライン・アクセス:http://edl.csrzic.com/thesisDetails#10.13890/j.issn.1000-128x.2013.01.005
その他の書誌記述
要約:Firstly, the module concept, packaging procedures, reliability and failure rules was presented. Then, the standard tests methodologies for investigating module reliability including endurance and environment tests were discussed. Lastly, the main failure mechanisms such as wire bonds failure, chip metallization reconstruction, solder layer fatigue and substrate delamination were studied.
ISSN:1000-128X