Application of Areal Topography Parameters in Surface Characterization

This review paper provides a comprehensive overview of selected 3D surface texture parameters defined by ISO 25178-2, with a focus on their metrological aspects in high-resolution measurements using atomic force microscopy (AFM). The parameters <i>Sa</i>, <i>Sz</i>, <i>...

Full description

Bibliographic Details
Published in:Applied Sciences
Main Authors: Vesna Alar, Andrej Razumić, Biserka Runje, Ivan Stojanović, Marin Kurtela, Branko Štrbac
Format: Article
Language:English
Published: MDPI AG 2025-06-01
Subjects:
surface texture characterization
areal topography parameters
atomic force microscopy (AFM)
measurement uncertainty
instrument calibration
Online Access:https://www.mdpi.com/2076-3417/15/12/6573

Internet

https://www.mdpi.com/2076-3417/15/12/6573

Similar Items