Environmental control for X-ray nanotomography

The acquisition speed and spatial resolution of X-ray nanotomography have continuously improved over the last decades. Coherent diffraction-based techniques breach the 10 nm resolution barrier frequently and thus pose stringent demands on sample positioning accuracy and stability. At the same time t...

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Bibliographic Details
Published in:Journal of Synchrotron Radiation
Main Authors: Mirko Holler, Tomas Aidukas, Lars Heller, Christian Appel, Nicholas W. Phillips, Elisabeth Müller-Gubler, Manuel Guizar-Sicairos, Jörg Raabe, Johannes Ihli
Format: Article
Language:English
Published: International Union of Crystallography 2022-09-01
Subjects:
in situ nano-tomography
ptychographic tomography
ptychography
environmental control
Online Access:http://scripts.iucr.org/cgi-bin/paper?S1600577522006968

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http://scripts.iucr.org/cgi-bin/paper?S1600577522006968

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