Error Analysis of the Combined-Scan High-Speed Atomic Force Microscopy
A combined tip-sample scanning architecture can improve the imaging speed of atomic force microscopy (AFM). However, the nonorthogonality between the three scanners and the nonideal response of each scanner cause measurement errors. In this article, the authors systematically analyze the influence o...
| 出版年: | Sensors |
|---|---|
| 主要な著者: | , , , , |
| フォーマット: | 論文 |
| 言語: | 英語 |
| 出版事項: |
MDPI AG
2021-09-01
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| 主題: | |
| オンライン･アクセス: | https://www.mdpi.com/1424-8220/21/18/6139 |