Manipulating scanning strategies towards controlled microstructure of laser remelted Mg–3Al–1Zn alloy
Various laser scanning strategies of multitrack products, consisting of a default Raster pattern (R1), a Raster pattern with a changed line order (R2), and a default Zigzag pattern (Z1), with different overlap rates ranged from 0.7 to 0.5, have been conducted to investigate microstructure evolution...
| Published in: | Journal of Materials Research and Technology |
|---|---|
| Main Authors: | , , , , , , , |
| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2024-05-01
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| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2238785424011967 |
