Radiation behaviour of mm‐wave on‐wafer probes in H‐band and the influence on antenna measurements
Abstract This letter presents a comprehensive analysis of the radiation behaviour exhibited by nine distinct on‐wafer radio‐freqeuncy (RF) probes used for device characterization in the mm‐wave bands of integrated circuits and antennas. The tested probes are sourced from two different manufacturers...
| الحاوية / القاعدة: | Electronics Letters |
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| المؤلفون الرئيسيون: | , , |
| التنسيق: | مقال |
| اللغة: | الإنجليزية |
| منشور في: |
Wiley
2024-02-01
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| الموضوعات: | |
| الوصول للمادة أونلاين: | https://doi.org/10.1049/ell2.13116 |