Modeling and Detection of Turn-to-Turn Faults in Shunt Reactors
In this paper, the analysis and simulation of shunt reactor turn-to-turn faults, as well as the algorithms for their detection, are presented. A simple equivalent circuit of a shunt reactor applicable for a small number of short-circuited turns was developed and applied to simulate such faults. It i...
| Published in: | IEEE Access |
|---|---|
| Main Authors: | , , |
| Format: | Article |
| Language: | English |
| Published: |
IEEE
2022-01-01
|
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9663380/ |