Generic Cryogenic CMOS Device Modeling and EDA-Compatible Platform for Reliable Cryogenic IC Design

This paper outlines the establishment of a generic cryogenic CMOS database in which key electrical parameters and transfer characteristics of the MOSFETs are quantified as functions of device size, temperature/frequency responses. Meanwhile, comprehensive device statistical analysis is conducted to...

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Bibliographic Details

Published in:	IEEE Journal of the Electron Devices Society
Main Authors:	Zhidong Tang, Zewei Wang, Yumeng Yuan, Chang He, Xin Luo, Ao Guo, Renhe Chen, Yongqi Hu, Longfei Yang, Chengwei Cao, Lin Lin Liu, Liujiang Yu, Ganbing Shang, Yongfeng Cao, Shoumian Chen, Yuhang Zhao, Shaojian Hu, Xufeng Kou
Format:	Article
Language:	English
Published:	IEEE 2025-01-01
Subjects:	Cryogenic device physics temperature-dependent compact model Monte-Carlo simulation process design kits cryogenic circuit design
Online Access:	https://ieeexplore.ieee.org/document/10891147/