CLG: Contrastive Label Generation with Knowledge for Few-Shot Learning

Training large-scale models needs big data. However, the few-shot problem is difficult to resolve due to inadequate training data. It is valuable to use only a few training samples to perform the task, such as using big data for application scenarios due to cost and resource problems. So, to tackle...

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Bibliographic Details
Published in:Mathematics
Main Authors: Han Ma, Baoyu Fan, Benjamin K. Ng, Chan-Tong Lam
Format: Article
Language:English
Published: MDPI AG 2024-02-01
Subjects:
Online Access:https://www.mdpi.com/2227-7390/12/3/472