Accurate determination of band tail properties in amorphous semiconductor thin film with Kelvin probe force microscopy
The disordered microscopic structure of amorphous semiconductors causes the formation of band tails in the density of states (DOS) that strongly affect charge transport properties. Such band tail properties are crucial for understanding and optimizing thin-film device performance with immense releva...
| Published in: | APL Materials |
|---|---|
| Main Authors: | , , , , , |
| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2023-06-01
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| Online Access: | http://dx.doi.org/10.1063/5.0151367 |