Fabbri, L., Bordoni, C., Barquinha, P., Crocco, J., Fraboni, B., & Cramer, T. (2023, June). Accurate determination of band tail properties in amorphous semiconductor thin film with Kelvin probe force microscopy. APL Materials.
توثيق أسلوب شيكاغو (الطبعة السابعة عشر)Fabbri, Luca, Camilla Bordoni, Pedro Barquinha, Jerome Crocco, Beatrice Fraboni, و Tobias Cramer. "Accurate Determination of Band Tail Properties in Amorphous Semiconductor Thin Film with Kelvin Probe Force Microscopy." APL Materials Jun. 2023.
توثيق جمعية اللغة المعاصرة MLA (الإصدار التاسع)Fabbri, Luca, et al. "Accurate Determination of Band Tail Properties in Amorphous Semiconductor Thin Film with Kelvin Probe Force Microscopy." APL Materials, Jun. 2023.
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