Recent Advances in In Situ 3D Surface Topographical Monitoring for Additive Manufacturing Processes

Additive manufacturing (AM) has revolutionized production across industries, yet persistent challenges in defect detection and process reliability necessitate advanced in situ monitoring solutions. While non-destructive evaluation (NDE) techniques such as X-ray computed tomography, thermography, and...

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Bibliographic Details

Published in:	Journal of Manufacturing and Materials Processing
Main Authors:	Vignesh Suresh, Badrinath Balasubramaniam, Li-Hsin Yeh, Beiwen Li
Format:	Article
Language:	English
Published:	MDPI AG 2025-04-01
Subjects:	additive manufacturing three-dimensional imaging in situ monitoring surface topography process monitoring defect detection
Online Access:	https://www.mdpi.com/2504-4494/9/4/133