Role of doping in probe microscopies for the Si(111) 7×7 surface

We investigate a scanning probe microscopy image flickering phenomenon, i.e., distinct changes in intensity with the tip height, observed on a B-doped Si(111) 7×7 reconstructed surface. The phenomenon is exclusively observed in heavily doped systems owing to large variations in the adatom heights (∼...

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Bibliographic Details

Published in:	Physical Review Research
Main Authors:	Dingxin Fan, Yuki Sakai, James R. Chelikowsky, Daniel Meuer, Alfred J. Weymouth, Franz J. Giessibl
Format:	Article
Language:	English
Published:	American Physical Society 2025-02-01
Online Access:	http://doi.org/10.1103/PhysRevResearch.7.L012046