Role of doping in probe microscopies for the Si(111) 7×7 surface
We investigate a scanning probe microscopy image flickering phenomenon, i.e., distinct changes in intensity with the tip height, observed on a B-doped Si(111) 7×7 reconstructed surface. The phenomenon is exclusively observed in heavily doped systems owing to large variations in the adatom heights (∼...
| الحاوية / القاعدة: | Physical Review Research |
|---|---|
| المؤلفون الرئيسيون: | , , , , , |
| التنسيق: | مقال |
| اللغة: | الإنجليزية |
| منشور في: |
American Physical Society
2025-02-01
|
| الوصول للمادة أونلاين: | http://doi.org/10.1103/PhysRevResearch.7.L012046 |