Quantitative wear evaluation of tips based on sharp structures

To comprehensively study the influence of atomic force microscopy (AFM) scanning parameters on tip wear, a tip wear assessment method based on sharp structures is proposed. This research explored the wear of AFM tips during tapping mode and examined the effects of scanning parameters on estimated ti...

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Bibliographic Details

Published in:	Beilstein Journal of Nanotechnology
Main Authors:	Ke Xu, Houwen Leng
Format:	Article
Language:	English
Published:	Beilstein-Institut 2024-02-01
Subjects:	atomic force microscopy estimated tip diameter scanning parameter tip reconstruction tip wear
Online Access:	https://doi.org/10.3762/bjnano.15.22