Extending the Depth of Focus of an Infrared Microscope Using a Binary Axicon Fabricated on Barium Fluoride

Axial resolution is one of the most important characteristics of a microscope. In all microscopes, a high axial resolution is desired in order to discriminate information efficiently along the longitudinal direction. However, when studying thick samples that do not contain laterally overlapping info...

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Bibliographic Details

Published in:	Micromachines
Main Authors:	Molong Han, Daniel Smith, Tauno Kahro, Dominyka Stonytė, Aarne Kasikov, Darius Gailevičius, Vipin Tiwari, Agnes Pristy Ignatius Xavier, Shivasubramanian Gopinath, Soon Hock Ng, Aravind Simon John Francis Rajeswary, Aile Tamm, Kaupo Kukli, Keith Bambery, Jitraporn Vongsvivut, Saulius Juodkazis, Vijayakumar Anand
Format:	Article
Language:	English
Published:	MDPI AG 2024-04-01
Subjects:	infrared microscopy axial resolution binary axicon photolithography femtosecond ablation chemical imaging
Online Access:	https://www.mdpi.com/2072-666X/15/4/537