A Sequential-Interval Optimal Sampling Strategy Based on Reliability Prediction Under Wiener Process

For satellite electronic components characterized by high reliability and long lifespan, achieving improved efficiency in reliability prediction is essential when only a limited amount of data is available. Many studies have collected degradation data using uniform sampling strategies. In this work,...

Full description

Bibliographic Details

Published in:	Mathematics
Main Authors:	Mengying Ren, Yubin Tian, Xingyu Liu, Furi Guo
Format:	Article
Language:	English
Published:	MDPI AG 2025-05-01
Subjects:	D-optimality degradation data G-optimality reliability prediction Wiener process
Online Access:	https://www.mdpi.com/2227-7390/13/11/1817