Identification of leaf rust resistance loci in a geographically diverse panel of wheat using genome-wide association analysis

Leaf rust, caused by Puccinia triticina (Pt) is among the most devastating diseases posing a significant threat to global wheat production. The continuously evolving virulent Pt races in North America calls for exploring new sources of leaf rust resistance. A diversity panel of 365 bread wheat acces...

Full description

Bibliographic Details

Published in:	Frontiers in Plant Science
Main Authors:	Shivreet Kaur, Harsimardeep S. Gill, Matthew Breiland, James A. Kolmer, Rajeev Gupta, Sunish K. Sehgal, Upinder Gill
Format:	Article
Language:	English
Published:	Frontiers Media S.A. 2023-02-01
Subjects:	leaf rust Puccinia triticana GWAS - genome-wide association study seedling resistance wheat QTL
Online Access:	https://www.frontiersin.org/articles/10.3389/fpls.2023.1090163/full