Effect of Thickness on Structural and Optical properties of ZnS:Mn films Prepared by RF magnetron Sputtering Method

In this study, ZnS: Mn thin films prepared by RF magnetron sputtering technique, were mixed 20 g of ZnS with Mn (2%), and deposited on glass substrate at temperature of 100oC with different thickness (404, 775, and 900) nm. The prepared films were investigated by X-ray diffraction (XRD), atomic for...

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Bibliographic Details

Published in:	Tikrit Journal of Pure Science
Main Authors:	Azhar Mohammed Abed, Abdulhussain K. Elttayef, Khalid Hamdi Razeg
Format:	Article
Language:	English
Published:	Tikrit University 2019-09-01
Subjects:	RF magnetron sputtering technique ZnS Nanoparticle X-ray diffraction SEM AFM UV technique
Online Access:	https://tjpsj.org/index.php/tjps/article/view/418