Quantifying grating defects in X-ray Talbot-Lau interferometry through a comparative study of two fabrication techniques

Abstract The performance of an X-ray grating interferometry system depends on the geometry and quality of the gratings. Fabrication of micrometer-pitch high-aspect-ratio gold gratings, which are essential for measuring small refraction angles at higher energies, is challenging. The two widely used t...

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Bibliographic Details

Published in:	Scientific Reports
Main Authors:	Alexandre Pereira, Simon Spindler, Zhitian Shi, Lucia Romano, Michał Rawlik, Federica Marone, Daniel Josell, Martin Stauber, Marco Stampanoni
Format:	Article
Language:	English
Published:	Nature Portfolio 2025-04-01
Online Access:	https://doi.org/10.1038/s41598-025-98148-z