Refractometric Sensing Using High-Order Diffraction Spots From Ordered Vertical Silicon Nanowire Arrays

We propose to use high-order diffraction spots from 2-D silicon nanowire (NW) arrays for refractive index sensing based on spatial changes in the diffractive spots position. The NW arrays act both as a refractive index sensor and as dispersive elements, eliminating the need for external spectrometer...

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Bibliographic Details

Published in:	IEEE Photonics Journal
Main Authors:	Iman Khodadad, Navneet Dhindsa, Simarjeet S. Saini
Format:	Article
Language:	English
Published:	IEEE 2016-01-01
Subjects:	Silicon nanowires refractive index sensors diffraction spectral analysis
Online Access:	https://ieeexplore.ieee.org/document/7444133/