Ultrashort electron bunches with subfemtosecond jitter from an X-band photocathode rf gun
The ultrafast electron beam diffraction technology, which involves an electron beam at the level of several megaelectron volts, is crucial for studying ultrafast dynamic processes at the atomic level. To discern these processes at a temporal resolution of a few femtoseconds, the demand to focus on e...
| 出版年: | Physical Review Accelerators and Beams |
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| 主要な著者: | , , , , , , , , |
| フォーマット: | 論文 |
| 言語: | 英語 |
| 出版事項: |
American Physical Society
2023-12-01
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| オンライン･アクセス: | http://doi.org/10.1103/PhysRevAccelBeams.26.123401 |