Deep Learning Approach for the Localization and Analysis of Surface Plasmon Scattering

Surface plasmon resonance microscopy (SPRM) combines the principles of traditional microscopy with the versatility of surface plasmons to develop label-free imaging methods. This paper describes a proof-of-principles approach based on deep learning that utilized the Y-Net convolutional neural networ...

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Bibliographic Details
Published in:Sensors
Main Authors: Jongha Lee, Gwiyeong Moon, Sukhyeon Ka, Kar-Ann Toh, Donghyun Kim
Format: Article
Language:English
Published: MDPI AG 2023-09-01
Subjects:
Online Access:https://www.mdpi.com/1424-8220/23/19/8100