Modeling the Impact of Fabrication Variabilities on the Performance of Silicon Avalanche Photodetectors

This work presents a systematic study of the sensitivities of silicon avalanche photodiode (APD) performance metrics, including gain, excess noise, and bandwidth, to potential variabilities in the fabrication process. The APDs simulations are performed using a state-of-the-art Full-Band Monte Carlo...

詳細記述

書誌詳細

出版年:	IEEE Photonics Journal
主要な著者:	David Liu, Luca F. Errico, Matteo G. C. Alasio, Mike Zhu, Enrico Bellotti
フォーマット:	論文
言語:	英語
出版事項:	IEEE 2024-01-01
主題:	Silicon photonics avalanche photodetector silicon APDs lateral avalanche photodetector integrated optoeletronics
オンライン･アクセス:	https://ieeexplore.ieee.org/document/10508076/