APA (7th ed.) Citation

Lü, W., Chen, D., Zhang, C., Wei, W., & Han, Y. (2023, April). Random ferroelectric and dielectric phase distribution-induced device variation of negative capacitance field-effect transistors. Results in Physics.

Chicago Style (17th ed.) Citation

Lü, Weifeng, Dengke Chen, Caiyun Zhang, Weijie Wei, and Ying Han. "Random Ferroelectric and Dielectric Phase Distribution-induced Device Variation of Negative Capacitance Field-effect Transistors." Results in Physics Apr. 2023.

MLA (9th ed.) Citation

Lü, Weifeng, et al. "Random Ferroelectric and Dielectric Phase Distribution-induced Device Variation of Negative Capacitance Field-effect Transistors." Results in Physics, Apr. 2023.