Peculiarities in XPS spectra of Sn/SiO2 layers as an effect of surface charge
X-ray photoelectron spectroscopy based on synchrotron radiation was used to investigate the composition of the observed SnO2-x/Sn:SiO2-x thin layer grown by organometallic chemical vapour deposition on single-crystalline silicon wafer with additional argon ions etching treatment. Due to the formatio...
| 出版年: | Results in Physics |
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| 主要な著者: | , , , |
| フォーマット: | 論文 |
| 言語: | 英語 |
| 出版事項: |
Elsevier
2024-06-01
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| 主題: | |
| オンライン･アクセス: | http://www.sciencedirect.com/science/article/pii/S2211379724004169 |