Thickness dependent oxidation in CrCl3: a scanning X-ray photoemission and Kelvin probe microscopies study

The modifications in the electronic properties induced by the thickness and size of an individual flake of transition-metal halides on different substrates (silicon oxide or In-doped tin oxide) are of particular technological interest, even more in the case of chromium trihalides (CrX3, X = Cl, Br,...

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書誌詳細

出版年:	Beilstein Journal of Nanotechnology
主要な著者:	Shafaq Kazim, Rahul Parmar, Maryam Azizinia, Matteo Amati, Muhammad Rauf, Andrea Di Cicco, Seyed Javid Rezvani, Dario Mastrippolito, Luca Ottaviano, Tomasz Klimczuk, Luca Gregoratti, Roberto Gunnella
フォーマット:	論文
言語:	英語
出版事項:	Beilstein-Institut 2025-06-01
主題:	chemical mapping crx3 kelvin probe force microscopy mechanical exfoliation scanning photoelectron microscopy (spem) two-dimensional material work function
オンライン･アクセス:	https://doi.org/10.3762/bjnano.16.58