Evaluation of the Structural Deviation of Cu/Cu₂O Nanocomposite Using the X-ray Diffraction Analysis Methods

We successfully synthesized Cu/Cu₂O nanocomposites using the wet chemical synthesis method. All X-ray diffraction (XRD), Reference Intensity Ratio (RIR), and Rietveld refinement methods confirmed that the compounds Cu and Cu₂O are free of impurities. Sca...

Full description

Bibliographic Details

Published in:	Crystals
Main Authors:	Nguyen Hoang Lam, Ryan P. Smith, Nam Le, Chau Thi Thanh Thuy, Mohaseen S. Tamboli, Asiya M. Tamboli, Sultan Alshehri, Mohammed M. Ghoneim, Nguyen Tam Nguyen Truong, Jae Hak Jung
Format:	Article
Language:	English
Published:	MDPI AG 2022-04-01
Subjects:	crystallization parameters Cu/Cu<sub>2</sub>O nanocomposite Nelson-Riley function Williamson-Hall X-ray diffraction
Online Access:	https://www.mdpi.com/2073-4352/12/4/566