Identification and validation of stable quantitative trait loci for yield component traits in wheat

Grain weight and grain number are important yield component traits in wheat and identification of underlying genetic loci is helpful for improving yield. Here, we identified eight stable quantitative trait loci (QTL) for yield component traits, including five loci for thousand grain weight (TGW) and...

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Bibliographic Details
Published in:Crop Journal
Main Authors: Lingli Li, Yingjie Bian, Yan Dong, Jie Song, Dan Liu, Jianqi Zeng, Fengju Wang, Yong Zhang, Zhonghu He, Xianchun Xia, Yan Zhang, Shuanghe Cao
Format: Article
Language:English
Published: KeAi Communications Co., Ltd. 2023-04-01
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Online Access:http://www.sciencedirect.com/science/article/pii/S2214514122002288