Image contrast reversals in contact resonance atomic force microscopy
Multiple image contrast inversions are observed along with the increase of modulation frequency for contact resonance atomic force microscopy (CR-AFM) imaging of a highly oriented pyrolytic graphite (HOPG) specimen. Analysis of the contact vibrational spectra indicates that the inversions can be att...
| Published in: | AIP Advances |
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| Main Authors: | , , |
| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2015-02-01
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| Online Access: | http://dx.doi.org/10.1063/1.4908037 |