Dielectric multilayers impact on radiation-induced charge accumulation in highly sensitive oxide field effect transistors

Radiation dosimetry is crucial in many fields where the exposure to ionizing radiation must be precisely controlled to avoid health and environmental safety issues. Among solid state detectors, we recently demonstrated that Radiation sensitive OXide Field Effect Transistors (ROXFETs) are excellent c...

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Bibliographic Details

Published in:	APL Materials
Main Authors:	Camilla Bordoni, Andrea Ciavatti, Mariana Cortinhal, Maria Pereira, Tobias Cramer, Pedro Barquinha, Beatrice Fraboni
Format:	Article
Language:	English
Published:	AIP Publishing LLC 2024-03-01
Online Access:	http://dx.doi.org/10.1063/5.0189167