Statistical Analysis of Measurement Processes Using Multi-Physic Instruments: Insights from Stitched Maps

Stitching methods allow one to measure a wider surface without the loss of resolution. The observation of small details with a better topographical representation is thus possible. However, it is not excluded that stitching methods generate some errors or aberrations on topography reconstruction. A...

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Bibliographic Details

Published in:	Metrology
Main Authors:	Clement Moreau, Julie Lemesle, David Páez Margarit, François Blateyron, Maxence Bigerelle
Format:	Article
Language:	English
Published:	MDPI AG 2024-03-01
Subjects:	instrument comparison stitching measurement assessment confocal microscopy focus variation microscopy interferometry
Online Access:	https://www.mdpi.com/2673-8244/4/2/10