Effect of heating and bending on localized critical current in 2G HTS tapes with non-contact trapped field measurements

Current-voltage measurement (I–V curve) is a typical method to identify the critical current (Ic) of second-generation high-temperature superconducting tapes (2G HTS tapes). However, it is difficult to characterize the local Ic of 2G HTS tape on the millimeter (mm) scale due to the set spacing of th...

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Bibliographic Details

Published in:	Journal of Materials Research and Technology
Main Authors:	Chia-Ming Yang, Qi-Fu Hong, Chi-Lei Chang, In-Gann Chen
Format:	Article
Language:	English
Published:	Elsevier 2024-09-01
Subjects:	Non-contact Trapped field measurement Ic measurement 2G HTS tapes Electromagnetic model
Online Access:	http://www.sciencedirect.com/science/article/pii/S2238785424018398