Orientational analysis of atomic pair correlations in nanocrystalline indium oxide thin films

The application of grazing-incidence total X-ray scattering (GITXS) for pair distribution function (PDF) analysis using >50 keV X-rays from synchrotron light sources has created new opportunities for structural characterization of supported thin films with high resolution. Compared with grazing-i...

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Bibliographic Details
Published in:IUCrJ
Main Authors: Justin M. Hoffman, Niklas B. Thompson, Olaf Borkiewicz, Xiang He, Samuel Amsterdam, Zhu-lin Xie, Aaron Taggart, Karen L. Mulfort, Alex B. F. Martinson, Lin X. Chen, Uta Ruett, David M. Tiede
Format: Article
Language:English
Published: International Union of Crystallography 2024-01-01
Subjects:
orientations
conductive thin films
atomic layer deposition
grazing-incidence diffraction
pair distribution functions
materials science
total x-ray scattering
inorganic chemistry
film anisotropy
amorphous materials
Online Access:http://scripts.iucr.org/cgi-bin/paper?S2052252523010357

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http://scripts.iucr.org/cgi-bin/paper?S2052252523010357

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