Pt thin-film resistance thermo detectors with stable interfaces for potential integration in SiC high-temperature pressure sensors
Abstract Due to the excellent mechanical, chemical, and electrical properties of third-generation semiconductor silicon carbide (SiC), pressure sensors utilizing this material might be able to operate in extreme environments with temperatures exceeding 300 °C. However, the significant output drift a...
| Published in: | Microsystems & Nanoengineering |
|---|---|
| Main Authors: | , , , , , , , , , , , , |
| Format: | Article |
| Language: | English |
| Published: |
Nature Publishing Group
2024-09-01
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| Online Access: | https://doi.org/10.1038/s41378-024-00746-w |
