Sparse Code With Minimum Hamming Distance of Three for Spin-Torque Transfer Magnetic Random Access Memory

Spin-torque-transfer magnetic random access memory (STT-MRAM) has recently emerged as a promising technology to replace dynamic random access memory (DRAM). However, STT-MRAM faces challenges due to process variations and thermal fluctuations, resulting in independent errors during the writing and r...

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Bibliographic Details
Published in:IEEE Access
Main Authors: Thien An Nguyen, Jaejin Lee
Format: Article
Language:English
Published: IEEE 2023-01-01
Subjects:
Online Access:https://ieeexplore.ieee.org/document/10283818/