Fast imaging of millimeter-scale areas with beam deflection transmission electron microscopy

Abstract Serial section transmission electron microscopy (TEM) has proven to be one of the leading methods for millimeter-scale 3D imaging of brain tissues at nanoscale resolution. It is important to further improve imaging efficiency to acquire larger and more brain volumes. We report here a threef...

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出版年:	Nature Communications
主要な著者:	Zhihao Zheng, Christopher S. Own, Adrian A. Wanner, Randal A. Koene, Eric W. Hammerschmith, William M. Silversmith, Nico Kemnitz, Ran Lu, David W. Tank, H. Sebastian Seung
フォーマット:	論文
言語:	英語
出版事項:	Nature Portfolio 2024-08-01
オンライン･アクセス:	https://doi.org/10.1038/s41467-024-50846-4