An Integrated Novel Framework for Coping Missing Values Imputation and Classification

This work presents an integrated framework for imputation of missing values and prediction of class label of unseen samples by using the best features of rule based inductive decision tree (DT) and Support Vector Machine (SVM) classifier (DT-SVM). In this work, the decision tree is used for imputati...

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書目詳細資料
發表在:IEEE Access
Main Authors: Monalisa Jena, Satchidananda Dehuri
格式: Article
語言:英语
出版: IEEE 2022-01-01
主題:
在線閱讀:https://ieeexplore.ieee.org/document/9810963/