Intrinsic AC Dielectric Breakdown Strength of Polyimide Films at the Extreme: New Breakthrough Insights on Thickness Dependence

Abstract To date, the AC dielectric breakdown strength of polyimide (PI) films, as for most polymers, is understood to follow a thickness dependency with a measured power law exponent, n ≈ 0.5. However, this work experimentally demonstrates that the AC dielectric strength of PI films is quasi‐thickn...

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Bibliographic Details
Published in:Advanced Materials Interfaces
Main Authors: Sombel Diaham, Paul Lambkin, Lawrence O'Sullivan, Baoxing Chen
Format: Article
Language:English
Published: Wiley-VCH 2024-02-01
Subjects:
Online Access:https://doi.org/10.1002/admi.202300822