Background Rejection in Two-Photon Fluorescence Image Scanning Microscopy

We discuss the properties of signal strength and integrated intensity in two-photon excitation confocal microscopy and image scanning microscopy. The resolution, optical sectioning and background rejection are all improved over nonconfocal two-photon microscopy. Replacing the pinhole of confocal two...

Full description

Bibliographic Details

Published in:	Photonics
Main Authors:	Colin J. R. Sheppard, Marco Castello, Giorgio Tortarolo, Alessandro Zunino, Eli Slenders, Paolo Bianchini, Giuseppe Vicidomini, Alberto Diaspro
Format:	Article
Language:	English
Published:	MDPI AG 2023-05-01
Subjects:	confocal microscopy two-photon microscopy image scanning microscopy
Online Access:	https://www.mdpi.com/2304-6732/10/5/601