Background Rejection in Two-Photon Fluorescence Image Scanning Microscopy

We discuss the properties of signal strength and integrated intensity in two-photon excitation confocal microscopy and image scanning microscopy. The resolution, optical sectioning and background rejection are all improved over nonconfocal two-photon microscopy. Replacing the pinhole of confocal two...

詳細記述

書誌詳細
出版年:Photonics
主要な著者: Colin J. R. Sheppard, Marco Castello, Giorgio Tortarolo, Alessandro Zunino, Eli Slenders, Paolo Bianchini, Giuseppe Vicidomini, Alberto Diaspro
フォーマット: 論文
言語:英語
出版事項: MDPI AG 2023-05-01
主題:
オンライン・アクセス:https://www.mdpi.com/2304-6732/10/5/601

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