Multi-Channel Time-Frequency Domain Deep CNN Approach for Machinery Fault Recognition Using Multi-Sensor Time-Series

In the industry, machinery failure causes catastrophic accidents and destructive damage to the machines. It causes the machinery to stop and reduces production, causing financial losses to the industry. As a result, identifying machine faults at an early stage is critical. With the rapid advancement...

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出版年:	IEEE Access
主要な著者:	Rakesh Reddy Yakkati, Sreenivasa Reddy Yeduri, Rajesh Kumar Tripathy, Linga Reddy Cenkeramaddi
フォーマット:	論文
言語:	英語
出版事項:	IEEE 2023-01-01
主題:	Deep CNN machinery failure Nvidia Jetson AGX Xavier Raspberry Pi time-frequency analysis wavelet synchro-squeezed transform
オンライン･アクセス:	https://ieeexplore.ieee.org/document/10286517/